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Moire alignment algorithm for an aberration-corrected holographic grating exposure system and error analysis 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 31
作者:  Zhao, X. L.;  Bayanheshig;  W. H. Li;  Y. X. Jiang;  Y. Song;  X. T. Li;  S. Jiang and N. Wu
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Field experiment and image reconstruction using a Fourier telescopy imaging system over a 600-m-long horizontal path 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 24
作者:  Yu, S. H.;  L. Dong;  X. Y. Liu;  X. D. Lin;  H. R. Megn and X. Zhong
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Disparity between online and offline tests in accelerated aging tests of LED lamps under electric stress 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 27
作者:  Wang, Y.;  L. Jing;  H. L. Ke;  J. Hao;  Q. Gao;  X. X. Wang;  Q. Sun and Z. J. Xu
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Measuring method of diffraction efficiency for plane grating based on Fourier spectral technology 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 3
作者:  Ma, Z. Y.;  X. D. Qi;  X. T. Li;  S. W. Zhang;  Bayanheshig;  H. Z. Yu;  H. L. Yu and Q. B. Jiao
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Removal of all mosaic grating errors in a single-interferometer system by a phase-difference reference window 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 28
作者:  Lu, Y. X.;  X. D. Qi;  X. T. Li;  H. L. Yu;  S. Jiang;  H. Bayan and L. Yin
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Improved method to fully compensate the spatial phase nonuniformity of LCoS devices with a Fizeau interferometer 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 28
作者:  Lu, Q.;  L. Sheng;  F. Zeng;  S. J. Gao and Y. F. Qiao
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Development of an immersive virtual reality head-mounted display with high performance 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 25
作者:  Wang, Y. Q.;  W. Q. Liu;  X. X. Meng;  H. Y. Fu;  D. L. Zhang;  Y. S. Kang;  R. Feng;  Z. L. Wei;  X. Q. Zhu and G. H. Jiang
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Simplified Phase Diversity algorithm based on a first-order Taylor expansion 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 28
作者:  Zhang, D.;  X. B. Zhang;  S. Y. Xu;  N. N. Liu and L. X. Zhao
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High-accuracy spectral reduction algorithm for the echelle spectrometer 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 13
作者:  Yin, L.;  Bayanheshig;  J. Yang;  Y. X. Lu;  R. Zhang;  C. Sun and J. C. Cui
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Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 22
作者:  Ke, H. L.;  L. Jing;  J. Hao;  Q. Gao;  Y. Wang;  X. X. Wang;  Q. Sun and Z. J. Xu
浏览  |  Adobe PDF(1348Kb)  |  收藏  |  浏览/下载:283/48  |  提交时间:2017/09/11