Changchun Institute of Optics,Fine Mechanics and Physics,CAS
| Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test | |
| Ke, H. L.; L. Jing; J. Hao; Q. Gao; Y. Wang; X. X. Wang; Q. Sun and Z. J. Xu | |
| 2016 | |
| 发表期刊 | Applied Optics
 |
| 卷号 | 55期号:22 |
| 摘要 | In active optics systems, one concern is how to quantitatively separate the effects of astigmatic and trefoil figure errors and misalignments that couple together in determining the total aberration fields when wavefront measurements are available at only a few field points. In this paper, we first quantitatively describe the impact of mount-induced trefoil deformation on the net aberration fields by proposing a modified theoretical formulation for the field-dependent aberration behavior of freeform surfaces based on the framework of nodal aberration theory. This formulation explicitly expresses the quantitative relationships between the magnitude of freeform surfaces and the induced aberration components where the freeform surfaces can be located away from the aperture stop and decentered from the optical axis. On this basis, and in combination with the mathematical presentation of nodal aberration theory for the effects of misalignments, we present the analytic expressions for the aberration fields of two-mirror telescopes in the presence of astigmatic primary mirror figure errors, mount-induced trefoil deformations on both mirrors, and misalignments. We quantitatively separate these effects using the analytical expressions with wavefront measurements at a few field points and pointing errors. Valuable insights are provided on how to separate these coupled effects in the computation process. Monte Carlo simulations are conducted to demonstrate the correctness and accuracy of the analytic method presented in this paper. (C) 2016 Optical Society of America |
| 文章类型 | 期刊 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 文献类型 | 期刊论文 |
| 条目标识符 | http://ir.ciomp.ac.cn/handle/181722/56999 |
| 专题 | 中科院长春光机所知识产出 |
| 推荐引用方式 GB/T 7714 | Ke, H. L.,L. Jing,J. Hao,et al. Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test[J]. Applied Optics,2016,55(22). |
| APA | Ke, H. L..,L. Jing.,J. Hao.,Q. Gao.,Y. Wang.,...&Q. Sun and Z. J. Xu.(2016).Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test.Applied Optics,55(22). |
| MLA | Ke, H. L.,et al."Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test".Applied Optics 55.22(2016). |
| 条目包含的文件 | 下载所有文件 | |||||
| 文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
| Analysis of junction（1348KB） | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | 浏览 下载 | |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论