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Carrier behavior in the vicinity of pit defects in GaN characterized by ultraviolet light-assisted Kelvin probe force microscopy 期刊论文
SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2019, 卷号: 62, 期号: 6, 页码: 6
作者:  Kai, CuiHong;  Sun, XiaoJuan;  Jia, YuPing;  Shi, ZhiMing;  Jiang, Ke;  Ben, JianWei;  Wu, You;  Wang, Yong;  Liu, HeNan;  Li, XiaoHang;  Li, DaBing
收藏  |  浏览/下载：606/0  |  提交时间：2019/05/22
pit defects  surface potential  electron concentration  
Point defects: key issues for -oxides wide-bandgap semiconductors development 期刊论文
Wuli Xuebao/Acta Physica Sinica, 2019, 卷号: 68, 期号: 16
作者:  X.-H.Xie;  B.-H.Li;  Z.-Z.Zhang;  L.Liu;  K.-W.Liu;  C.-X.Shan
浏览  |  Adobe PDF(2069Kb)  |  收藏  |  浏览/下载：225/49  |  提交时间：2020/08/24
Wide band gap semiconductors,Arc lamps,Beryllia,Binding energy,Doping (additives),Electroluminescence,Energy gap,II-VI semiconductors,Ionization of gases,Ionization potential,Magnesia,Magnetic semiconductors,Point defects,Semiconductor doping,Semiconductor lasers,Semiconductor quantum wells,Ultraviolet lasers,Zinc oxide  
Improvement of the photovoltaic performance of Ag-alloyed Cu2ZnSn(S,Se)(4)-based solar cells by optimizing the selenization temperature 期刊论文
Superlattices and Microstructures, 2019, 卷号: 125, 页码: 287-294
作者:  X.L.Zhai;  B.Yao;  Y.F.Li;  Z.H.Ding;  R.Deng;  Y.R.Sui;  H.F.Zhao
浏览  |  Adobe PDF(2249Kb)  |  收藏  |  浏览/下载：355/61  |  提交时间：2020/08/24
Cu2ZnSn(S,Se)(4),Ag doping,Solar cell,Selenization temperature,Power,conversion efficiency,thin-films,grain-size,cu2znsns4,elimination,precursors,efficiency,defects,growth,Physics  
Modeling multilayer coating profiles with defects on EUV collector with grating 期刊论文
Optical Engineering, 2019, 卷号: 58, 期号: 10, 页码: 9
作者:  S.Z.Sun;  C.S.Jin;  B.Yu;  T.Guo;  S.Yao;  W.Y.Deng;  C.Li
浏览  |  Adobe PDF(1912Kb)  |  收藏  |  浏览/下载：223/54  |  提交时间：2020/08/24
EUV collector with grating,multilayer coating profile,coating defects,deposition model,EUV reflectance,lithography,Optics  
Laser-induced defects in optical multilayer coatings by the spatial resolved method 期刊论文
Chinese Optics Letters, 2019, 卷号: 17, 期号: 3, 页码: 5
作者:  C.Shan;  Y.N.Zhao;  Y.Q.Gao;  X.H.Zhao;  G.H.Hu;  W.X.Ma
浏览  |  Adobe PDF(1000Kb)  |  收藏  |  浏览/下载：184/71  |  提交时间：2020/08/24
induced damage,nodular defects,threshold,performance,mirrors,Optics  
Passivation Mechanism of Nitrogen in ZnO under Different Oxygen Ambience 期刊论文
Crystals, 2019, 卷号: 9, 期号: 4, 页码: 7
作者:  X.Y.Chen;  Z.Z.Zhang;  Y.Y.Zhang;  B.Yao;  B.H.Li;  Q.Gong
浏览  |  Adobe PDF(1213Kb)  |  收藏  |  浏览/下载：248/92  |  提交时间：2020/08/24
molecular beam epitaxy,ZnO,dopant,defects,x-ray photoelectron,optical-properties,thin-films  
Correction Technology of HgCdTe Short-Wave Infrared Focal Plane Arrays 期刊论文
Guangxue Xuebao/Acta Optica Sinica, 2019, 卷号: 39, 期号: 2
作者:  J.Chen;  J.Cui;  J.Liu;  J.Liu;  X.Yao;  J.Yang;  C.Sun
浏览  |  Adobe PDF(708Kb)  |  收藏  |  浏览/下载：203/59  |  提交时间：2020/08/24
Pixels,Cadmium alloys,Defects,Detectors,Focal plane arrays,Focusing  
Approach to cross-company spacecraft software defect prediction based on transfer learning 期刊论文
Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2019, 卷号: 27, 期号: 2, 页码: 469-478
作者:  Q.-H.Ha;  D.-Y.Liu;  Y.Chen;  L.Liu
浏览  |  Adobe PDF(1286Kb)  |  收藏  |  浏览/下载：205/79  |  提交时间：2020/08/24
Software testing,Aerospace engineering,Application programs,Classification (of information),Defects,Efficiency,Forecasting,Learning systems  
Infrared and low-light-level image fusion based on 2-energy minimization and mixed-1-gradient regularization 期刊论文
Infrared Physics and Technology, 2019, 卷号: 96, 页码: 163-173
作者:  B.Cheng;  L.Jin;  G.Li
浏览  |  Adobe PDF(1720Kb)  |  收藏  |  浏览/下载：234/63  |  提交时间：2020/08/24
Image fusion,Defects,Image enhancement,Image reconstruction,Infrared imaging  
Detection system of multilayer coating microstructure defects based on differential interference contrast confocal microscopy 期刊论文
Chinese Optics, 2018, 卷号: 11, 期号: 2, 页码: 255-264
作者:  Dai, Cen;  Gong, Yan;  Zhang, Hao;  Li, Dian-Meng;  Xue, Jin-Lai
浏览  |  Adobe PDF(2558Kb)  |  收藏  |  浏览/下载：362/118  |  提交时间：2019/09/17
Multilayers  Coatings  Confocal microscopy  Defects  Diffraction  Extreme ultraviolet lithography  Microstructure