CIOMP OpenIR

Browse/Search Results:  1-1 of 1 Help

Selected(0)Clear Items/Page:    Sort:
Carrier behavior in the vicinity of pit defects in GaN characterized by ultraviolet light-assisted Kelvin probe force microscopy 期刊论文
SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2019, 卷号: 62, 期号: 6, 页码: 6
Authors:  Kai, CuiHong;  Sun, XiaoJuan;  Jia, YuPing;  Shi, ZhiMing;  Jiang, Ke;  Ben, JianWei;  Wu, You;  Wang, Yong;  Liu, HeNan;  Li, XiaoHang;  Li, DaBing
Favorite  |  View/Download:436/0  |  Submit date:2019/05/22
pit defects  surface potential  electron concentration