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Ion-bombardment-induced reduction in vacancies and its enhanced effect on conductivity and reflectivity in hafnium nitride films 期刊论文
Applied Physics a-Materials Science & Processing, 2016, 卷号: 122, 期号: 8
作者:  Gu, Z. Q.;  J. F. Wang;  C. Q. Hu;  X. B. Zhang;  J. C. Dang;  S. Zhang;  J. Gao;  X. Y. Wang;  H. Chen and W. T. Zheng
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Comparison of high-order-harmonic generation on single-layer graphene flakes with armchair and zigzag types in an intense laser field 期刊论文
Physical Review A, 2016, 卷号: 93, 期号: 3
作者:  Guo, J.;  H. Y. Zhong;  B. Yan;  Y. Chen;  Y. F. Jiang;  T. F. Wang;  J. F. Shao;  C. B. Zheng and X. S. Liu
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Broadband Photoresponse Enhancement of a High-Performance t-Se Microtube Photodetector by Plasmonic Metallic Nanoparticles 期刊论文
Advanced Functional Materials, 2016, 卷号: 26, 期号: 36
作者:  Hu, K.;  H. Y. Chen;  M. M. Jiang;  F. Teng;  L. X. Zheng and X. S. Fang
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Effective method to study the thickness-dependent dielectric functions of nanometal thin film 期刊论文
Optics Letters, 2016, 卷号: 41, 期号: 21
作者:  Hu, E. T.;  Q. Y. Cai;  R. J. Zhang;  Y. F. Wei;  W. C. Zhou;  S. Y. Wang;  Y. X. Zheng;  W. Wei and L. Y. Chen
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Swing arm profilometer: analytical solutions of misalignment errors for testing axisymmetric optics 期刊论文
Optical Engineering, 2016, 卷号: 55, 期号: 7
作者:  Xiong, L.;  X. Luo;  Z. Y. Liu;  X. K. Wang;  H. X. Hu;  F. Zhang;  L. G. Zheng and X. J. Zhang
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Modelling of XCO2 Surfaces Based on Flight Tests of TanSat Instruments 期刊论文
Sensors, 2016, 卷号: 16, 期号: 11
作者:  Zhang, L. L.;  T. X. Yue;  J. P. Wilson;  D. Y. Wang;  N. Zhao;  Y. Liu;  D. D. Liu;  Z. P. Du;  Y. F. Wang;  C. Lin;  Y. Q. Zheng and J. H. Guo
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Ultrasensitive Self-Powered Solar-Blind Deep-Ultraviolet Photodetector Based on All-Solid-State Polyaniline/MgZnO Bilayer 期刊论文
Small, 2016, 卷号: 12, 期号: 42
作者:  Chen, H. Y.;  P. P. Yu;  Z. Z. Zhang;  F. Teng;  L. X. Zheng;  K. Hu and X. S. Fang
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Detection of an ordered-structure fraction in amorphous silicon 期刊论文
Journal of Applied Crystallography, 2016, 卷号: 49
作者:  Wang, X. D.;  B. Chen;  H. F. Wang;  X. Zheng;  S. J. Liu;  J. B. Wang;  B. Li;  S. M. Yu and Z. X. Cui
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