Detection of an ordered-structure fraction in amorphous silicon

	Detection of an ordered-structure fraction in amorphous silicon
	Wang, X. D.; B. Chen; H. F. Wang; X. Zheng; S. J. Liu; J. B. Wang; B. Li; S. M. Yu and Z. X. Cui
	2016
发表期刊	Journal of Applied Crystallography
卷号	49
摘要	Dynamic modeling and simulation of a 6-UHP (universal-Hooke-prismatic) parallel platform under base excitation are studied for the requirements of vibration isolation and precision pointing technology. Firstly, the structure characteristics of 6-UHP parallel platform are introduced. Then, the theoretical modeling based on Kane formulation is performed, and the complete dynamic equation of the parallel platform is derived. Finally, the theoretical model of the parallel platform is verified by co-simulation. The results indicate that the 6-dimensional acceleration curve obtained from simulation is similar to the input acceleration curve, the maximum relative error is 5.40%, and the minimum relative error is 0.25%. Thus, the accuracy of the dynamic model is fully verified. 2016, Science Press. All right reserved.
文章类型	期刊
收录类别	SCI ; EI
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/57251
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Wang, X. D.,B. Chen,H. F. Wang,et al. Detection of an ordered-structure fraction in amorphous silicon[J]. Journal of Applied Crystallography,2016,49.
APA	Wang, X. D..,B. Chen.,H. F. Wang.,X. Zheng.,S. J. Liu.,...&S. M. Yu and Z. X. Cui.(2016).Detection of an ordered-structure fraction in amorphous silicon.Journal of Applied Crystallography,49.
MLA	Wang, X. D.,et al."Detection of an ordered-structure fraction in amorphous silicon".Journal of Applied Crystallography 49(2016).

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