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Carrier behavior in the vicinity of pit defects in GaN characterized by ultraviolet light-assisted Kelvin probe force microscopy 期刊论文
SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2019, 卷号: 62, 期号: 6, 页码: 6
作者:  Kai, CuiHong;  Sun, XiaoJuan;  Jia, YuPing;  Shi, ZhiMing;  Jiang, Ke;  Ben, JianWei;  Wu, You;  Wang, Yong;  Liu, HeNan;  Li, XiaoHang;  Li, DaBing
收藏  |  浏览/下载：627/0  |  提交时间：2019/05/22
pit defects  surface potential  electron concentration  
Influence of Dislocations on the Refractive Index of AlN by Nanoscale Strain Field 期刊论文
Nanoscale Research Letters, 2019, 卷号: 14, 期号: 1
作者:  Ben,Jianwei;  Sun,Xiaojuan;  Jia,Yuping;  Jiang,Ke;  Shi,Zhiming;  Wu,You;  Kai,Cuihong;  Wang,Yong;  Luo,Xuguang;  Feng,Zhe Chuan;  Li,Dabing
收藏  |  浏览/下载：427/0  |  提交时间：2019/08/21
Refractive index  AlN  Threading dislocation density  Nanoscale strain field around dislocations