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Optical design and fabrication of palm/fingerprint uniform illumination system with a high-power near-infrared light-emitting diode 期刊论文
Applied Optics, 2017, 卷号: 56, 期号: 17
作者:  Jing, L.;  Y. Wang;  H. F. Zhao;  H. L. Ke;  X. X. Wang and Q. Gao
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Determination of cut-off time of accelerated aging test under temperature stress for LED lamps 期刊论文
Frontiers of Information Technology & Electronic Engineering, 2017, 卷号: 18, 期号: 8
作者:  Hao, J.;  L. Jing;  H. L. Ke;  Y. Wang;  Q. Gao;  X. X. Wang;  Q. Sun and Z. J. Xu
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A new optimization method of freeform surface lens based on non-imaging optics for led source 期刊论文
Optik, 2017, 卷号: 134
作者:  Hao, J.;  H. L. Ke;  Y. Wang;  L. Jing;  H. Liu;  Q. Sun and Z. Q. Wang
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Disparity between online and offline tests in accelerated aging tests of LED lamps under electric stress 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 27
作者:  Wang, Y.;  L. Jing;  H. L. Ke;  J. Hao;  Q. Gao;  X. X. Wang;  Q. Sun and Z. J. Xu
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The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress 期刊论文
Ieee Transactions on Electron Devices, 2016, 卷号: 63, 期号: 3
作者:  Hao, J.;  Q. Sun;  Z. J. Xu;  L. Jing;  Y. Wang and H. L. Ke
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Estimation of the average junction temperature of two phosphors-converted white LED array based on (B plus Y plus R)/B ratio 期刊论文
Solid-State Electronics, 2016, 卷号: 121
作者:  Ke, H. L.;  L. Jing;  J. Hao;  Q. Gao;  Y. Wanga;  X. X. Wang;  Q. Sun and Z. J. Xu
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Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 22
作者:  Ke, H. L.;  L. Jing;  J. Hao;  Q. Gao;  Y. Wang;  X. X. Wang;  Q. Sun and Z. J. Xu
浏览  |  Adobe PDF(1348Kb)  |  收藏  |  浏览/下载:283/48  |  提交时间:2017/09/11