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Determination of cut-off time of accelerated aging test under temperature stress for LED lamps 期刊论文
Frontiers of Information Technology & Electronic Engineering, 2017, 卷号: 18, 期号: 8
作者:  Hao, J.;  L. Jing;  H. L. Ke;  Y. Wang;  Q. Gao;  X. X. Wang;  Q. Sun and Z. J. Xu
浏览  |  Adobe PDF(2896Kb)  |  收藏  |  浏览/下载：334/78  |  提交时间：2018/06/13
Disparity between online and offline tests in accelerated aging tests of LED lamps under electric stress 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 27
作者:  Wang, Y.;  L. Jing;  H. L. Ke;  J. Hao;  Q. Gao;  X. X. Wang;  Q. Sun and Z. J. Xu
浏览  |  Adobe PDF(745Kb)  |  收藏  |  浏览/下载：306/77  |  提交时间：2017/09/11
The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress 期刊论文
Ieee Transactions on Electron Devices, 2016, 卷号: 63, 期号: 3
作者:  Hao, J.;  Q. Sun;  Z. J. Xu;  L. Jing;  Y. Wang and H. L. Ke
浏览  |  Adobe PDF(2301Kb)  |  收藏  |  浏览/下载：298/87  |  提交时间：2017/09/11
New method of online testing and data processing for LED lamps 期刊论文
Journal of Southeast University (English Edition), 2016, 卷号: 32, 期号: 4
作者:  Hao, J.;  L. Jing;  H. Ke;  Y. Wang;  Q. Gao;  X. Wang;  Q. Sun and Z. Xu
浏览  |  Adobe PDF(698Kb)  |  收藏  |  浏览/下载：314/74  |  提交时间：2017/09/11
Estimation of the average junction temperature of two phosphors-converted white LED array based on (B plus Y plus R)/B ratio 期刊论文
Solid-State Electronics, 2016, 卷号: 121
作者:  Ke, H. L.;  L. Jing;  J. Hao;  Q. Gao;  Y. Wanga;  X. X. Wang;  Q. Sun and Z. J. Xu
浏览  |  Adobe PDF(2059Kb)  |  收藏  |  浏览/下载：223/9  |  提交时间：2017/09/11
Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test 期刊论文
Applied Optics, 2016, 卷号: 55, 期号: 22
作者:  Ke, H. L.;  L. Jing;  J. Hao;  Q. Gao;  Y. Wang;  X. X. Wang;  Q. Sun and Z. J. Xu
浏览  |  Adobe PDF(1348Kb)  |  收藏  |  浏览/下载：281/47  |  提交时间：2017/09/11
Multispectral image enhancement based on irradiation-reflection model and bounded operation 期刊论文
Acta Physica Sinica, 2015, 卷号: 64, 期号: 10
作者:  G. L. Bi;  Z. J. Xu;  J. Zhao and Q. Sun
浏览  |  Adobe PDF(651Kb)  |  收藏  |  浏览/下载：335/94  |  提交时间：2016/08/04
Comparison of online and offline tests in LED accelerated reliability tests under temperature stress 期刊论文
Applied Optics, 2015, 卷号: 54, 期号: 33, 页码: 9906-9910
作者:  Ke, H. L.;  L. Jing;  Q. Gao;  Y. Wang;  J. Hao;  Q. Sun and Z. J. Xu
浏览  |  Adobe PDF(1192Kb)  |  收藏  |  浏览/下载：218/44  |  提交时间：2016/07/15