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Carrier behavior in the vicinity of pit defects in GaN characterized by ultraviolet light-assisted Kelvin probe force microscopy 期刊论文
SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2019, 卷号: 62, 期号: 6, 页码: 6
作者:  Kai, CuiHong;  Sun, XiaoJuan;  Jia, YuPing;  Shi, ZhiMing;  Jiang, Ke;  Ben, JianWei;  Wu, You;  Wang, Yong;  Liu, HeNan;  Li, XiaoHang;  Li, DaBing
收藏  |  浏览/下载：511/0  |  提交时间：2019/05/22
pit defects  surface potential  electron concentration  
Laser-induced defects in optical multilayer coatings by the spatial resolved method 期刊论文
Chinese Optics Letters, 2019, 卷号: 17, 期号: 3, 页码: 5
作者:  C.Shan;  Y.N.Zhao;  Y.Q.Gao;  X.H.Zhao;  G.H.Hu;  W.X.Ma
浏览  |  Adobe PDF(1000Kb)  |  收藏  |  浏览/下载：132/53  |  提交时间：2020/08/24
induced damage,nodular defects,threshold,performance,mirrors,Optics