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| Determination of cut-off time of accelerated aging test under temperature stress for LED lamps 期刊论文 Frontiers of Information Technology & Electronic Engineering, 2017, 卷号: 18, 期号: 8 作者: Hao, J.; L. Jing; H. L. Ke; Y. Wang; Q. Gao; X. X. Wang; Q. Sun and Z. J. Xu 浏览  |  Adobe PDF(2896Kb)  |  收藏  |  浏览/下载:392/101  |  提交时间:2018/06/13 |
| Step-down accelerated aging test for LED lamps based on nelson models 期刊论文 Optik, 2017, 卷号: 149 作者: Hao, J.; D. M. Li; C. D. He; Q. Sun and H. L. Ke 浏览  |  Adobe PDF(1821Kb)  |  收藏  |  浏览/下载:239/76  |  提交时间:2018/06/13 |
| A new optimization method of freeform surface lens based on non-imaging optics for led source 期刊论文 Optik, 2017, 卷号: 134 作者: Hao, J.; H. L. Ke; Y. Wang; L. Jing; H. Liu; Q. Sun and Z. Q. Wang 浏览  |  Adobe PDF(2337Kb)  |  收藏  |  浏览/下载:269/96  |  提交时间:2018/06/13 |
| Disparity between online and offline tests in accelerated aging tests of LED lamps under electric stress 期刊论文 Applied Optics, 2016, 卷号: 55, 期号: 27 作者: Wang, Y.; L. Jing; H. L. Ke; J. Hao; Q. Gao; X. X. Wang; Q. Sun and Z. J. Xu 浏览  |  Adobe PDF(745Kb)  |  收藏  |  浏览/下载:367/108  |  提交时间:2017/09/11 |
| The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress 期刊论文 Ieee Transactions on Electron Devices, 2016, 卷号: 63, 期号: 3 作者: Hao, J.; Q. Sun; Z. J. Xu; L. Jing; Y. Wang and H. L. Ke 浏览  |  Adobe PDF(2301Kb)  |  收藏  |  浏览/下载:343/120  |  提交时间:2017/09/11 |
| New method of online testing and data processing for LED lamps 期刊论文 Journal of Southeast University (English Edition), 2016, 卷号: 32, 期号: 4 作者: Hao, J.; L. Jing; H. Ke; Y. Wang; Q. Gao; X. Wang; Q. Sun and Z. Xu 浏览  |  Adobe PDF(698Kb)  |  收藏  |  浏览/下载:336/87  |  提交时间:2017/09/11 |
| Estimation of the average junction temperature of two phosphors-converted white LED array based on (B plus Y plus R)/B ratio 期刊论文 Solid-State Electronics, 2016, 卷号: 121 作者: Ke, H. L.; L. Jing; J. Hao; Q. Gao; Y. Wanga; X. X. Wang; Q. Sun and Z. J. Xu 浏览  |  Adobe PDF(2059Kb)  |  收藏  |  浏览/下载:260/11  |  提交时间:2017/09/11 |
| Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test 期刊论文 Applied Optics, 2016, 卷号: 55, 期号: 22 作者: Ke, H. L.; L. Jing; J. Hao; Q. Gao; Y. Wang; X. X. Wang; Q. Sun and Z. J. Xu 浏览  |  Adobe PDF(1348Kb)  |  收藏  |  浏览/下载:305/57  |  提交时间:2017/09/11 |
| Comparison of online and offline tests in LED accelerated reliability tests under temperature stress 期刊论文 Applied Optics, 2015, 卷号: 54, 期号: 33, 页码: 9906-9910 作者: Ke, H. L.; L. Jing; Q. Gao; Y. Wang; J. Hao; Q. Sun and Z. J. Xu 浏览  |  Adobe PDF(1192Kb)  |  收藏  |  浏览/下载:237/53  |  提交时间:2016/07/15 |