The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress

	The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress
	Hao, J.; Q. Sun; Z. J. Xu; L. Jing; Y. Wang and H. L. Ke
	2016
发表期刊	Ieee Transactions on Electron Devices (IF:2.913[JCR-2019],2.737[5-Year])
卷号	63 期号:3
文章类型	期刊
收录类别	SCI ; EI
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/56956
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Hao, J.,Q. Sun,Z. J. Xu,et al. The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress[J]. Ieee Transactions on Electron Devices,2016,63(3).
APA	Hao, J.,Q. Sun,Z. J. Xu,L. Jing,&Y. Wang and H. L. Ke.(2016).The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress.Ieee Transactions on Electron Devices,63(3).
MLA	Hao, J.,et al."The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress".Ieee Transactions on Electron Devices 63.3(2016).