Hao, J.,Q. Sun,Z. J. Xu,et al. The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress[J]. Ieee Transactions on Electron Devices,2016,63(3).
APA
Hao, J.,Q. Sun,Z. J. Xu,L. Jing,&Y. Wang and H. L. Ke.(2016).The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress.Ieee Transactions on Electron Devices,63(3).
MLA
Hao, J.,et al."The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress".Ieee Transactions on Electron Devices 63.3(2016).
修改评论