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Improving the adhesion of hydrogen silsesquioxane (HSQ) onto various substrates for electron-beam lithography by surface chemical modification
Zhang Z. Q.; Duan H. G.; Wu Y. H.; Zhou W. P.; Liu C.; Tang Y. G.; Li H. W.
2014
发表期刊Microelectronic Engineering
ISSNISBN/0167-9317
期号128页码:59-65
摘要Hydrogen silsesquioxane (HSQ) is an excellent negative-tone resist for electron-beam lithography and sub-5-nm-half-pitch patterns can be achieved using high contrast development processes. However, the quality of HSQ adhesion on different types of substrates varies, thus limiting the function of HSQ in etching masks or metal lift-off process on various substrates. In this study, we proposed several chemical modification methods to improve HSQ adhesion resist onto Si, Cr, Cu, Mo, Au, and indium-tin oxide (ITO) substrates. HSQ adhesion patterns onto Au substrates was significantly improved by utilizing (3-mercaptopropyl) trimethoxysilane (MPTMS) and Poly (diallyldimethylammonium) chloride (PDDA) modifications. The (3-Aminopropyl) triethoxysilane (APTES) enhances the HSQ adhesion on Mo substrates. APTES and PDDA improve HSQ adhesion on Si, Cr, Cu and ITO. The improved adhesive HSQ nanopatterns on these substrates may benefit the fabrication of various nanophotonic and nanoelectronic devices. (C) 2014 Elsevier B.V. All rights reserved.
收录类别SCI ; EI
语种英语
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/44071
专题中科院长春光机所知识产出
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Zhang Z. Q.,Duan H. G.,Wu Y. H.,et al. Improving the adhesion of hydrogen silsesquioxane (HSQ) onto various substrates for electron-beam lithography by surface chemical modification[J]. Microelectronic Engineering,2014(128):59-65.
APA Zhang Z. Q..,Duan H. G..,Wu Y. H..,Zhou W. P..,Liu C..,...&Li H. W..(2014).Improving the adhesion of hydrogen silsesquioxane (HSQ) onto various substrates for electron-beam lithography by surface chemical modification.Microelectronic Engineering(128),59-65.
MLA Zhang Z. Q.,et al."Improving the adhesion of hydrogen silsesquioxane (HSQ) onto various substrates for electron-beam lithography by surface chemical modification".Microelectronic Engineering .128(2014):59-65.
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