Echelle-emission spectrometer with divided spectral coverage

	Echelle-emission spectrometer with divided spectral coverage
	Zhu W.-Y.; Chen S.-J.; Han P.-P.; Cui J.-C.; Cao H.-X.; Bayanheshig; Qi X.-D.; Tang Y.-G.
	2014
发表期刊	Guangxue Jingmi Gongcheng/Optics and Precision Engineering
ISSN	ISBN/1004924X
卷号	22 期号:4 页码:870-876
摘要	Limited by the development of detectors, the Inductively Coupled Plasma Atomic Emission Spectrometry(ICP-AES) based on an echelle spectrograph is difficult to complete the multiple element measurement at a wider spectral coverage. This paper focuses on the improvement of an existing echelle spectrograph. It designs a new wider band echelle spectrograph suitable for ICP-AES to measure multiple elements simultaneously. By changing the incident angle of the prism, the wavelength of system is extented 200-900 nm with a spectral resolution of 25 000, which breaks the limitation of existing detector sizes, and realizes rapid and simultaneous measurement for multiple elements at a wider spectral range.By combination the Echelle spectrograph and a ICP, several specimens are measured and analyzed. Experiments show that the ICP-AES with Echelle spectrograph is available to detect multiple elements within a short time correctly, and the wavelength precision is better than 0.01 nm. The wavelength range, optical spectral resolution and the precision of wavelength calibration of the Echelle spectrograph meet the design needs.
收录类别	EI
语种	中文
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/43916
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Zhu W.-Y.,Chen S.-J.,Han P.-P.,et al. Echelle-emission spectrometer with divided spectral coverage[J]. Guangxue Jingmi Gongcheng/Optics and Precision Engineering,2014,22(4):870-876.
APA	Zhu W.-Y..,Chen S.-J..,Han P.-P..,Cui J.-C..,Cao H.-X..,...&Tang Y.-G..(2014).Echelle-emission spectrometer with divided spectral coverage.Guangxue Jingmi Gongcheng/Optics and Precision Engineering,22(4),870-876.
MLA	Zhu W.-Y.,et al."Echelle-emission spectrometer with divided spectral coverage".Guangxue Jingmi Gongcheng/Optics and Precision Engineering 22.4(2014):870-876.

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