CIOMP OpenIR

浏览/检索结果: 共1条,第1-1条 帮助

限定条件            
已选(0)清除 条数/页:   排序方式:
Roughness reduction of large-area high-quality thick Al films for echelle gratings by multi-step deposition method 期刊论文
Optics Express, 2015, 卷号: 23, 期号: 18, 页码: 23738-23747
作者:  Li, Z. Z.;  J. S. Gao;  H. G. Yang;  T. T. Wang and X. Y. Wang
Adobe PDF(2367Kb)  |  收藏  |  浏览/下载:202/69  |  提交时间:2016/07/15