CIOMP OpenIR
平面光栅衍射效率测试系统
于宏柱
2018
Source Publication长春工业大学学报
Issue05Pages:499-504
Abstract采用双CT结构以及光路追迹的优化光路系统,将光斑自动调整与三轴转台结合实现不同规格待测光栅的自动装调。实验结果表明,测量重复性误差小于2%。
Keyword平面光栅 衍射效率 光线追迹
Document Type期刊论文
Identifierhttp://ir.ciomp.ac.cn/handle/181722/61452
Collection中国科学院长春光学精密机械与物理研究所
Recommended Citation
GB/T 7714
于宏柱. 平面光栅衍射效率测试系统[J]. 长春工业大学学报,2018(05):499-504.
APA 于宏柱.(2018).平面光栅衍射效率测试系统.长春工业大学学报(05),499-504.
MLA 于宏柱."平面光栅衍射效率测试系统".长春工业大学学报 .05(2018):499-504.
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