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Electrical Derivative Measurement of High-Power InGaAs LDs Under Scanning Current with Variable Step
Tao, M.; J. Guan; F. L. Gao; L. L. Gao and J. S. Cao
2017
发表期刊Chinese Journal of Electronics
卷号26期号:3
摘要For the large driving current of high-power semiconductor Laser diodes (LDs), a modified method to measure the electrical derivative of LDs under scanning driving current with variable step length is proposed, which is to achieve the fast and accurate measurement of optical and electrical characteristic parameters of LDs with a relatively small data acquisition. The experimental results show that, with fewer measurements, this method can effectively and accurately measure and extract the LDs corresponding parameters including threshold current (I-th), voltage-current characteristic (V-I), luminous power-current relation (P-I), electrical derivative curve (IdV/dI-I). The wavelet transformation singularity testing results of the threshold current also verify the accuracy, reliability, and advantage of this method.
收录类别sci ; ei
语种英语
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/59217
专题中科院长春光机所知识产出
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GB/T 7714
Tao, M.,J. Guan,F. L. Gao,et al. Electrical Derivative Measurement of High-Power InGaAs LDs Under Scanning Current with Variable Step[J]. Chinese Journal of Electronics,2017,26(3).
APA Tao, M.,J. Guan,F. L. Gao,&L. L. Gao and J. S. Cao.(2017).Electrical Derivative Measurement of High-Power InGaAs LDs Under Scanning Current with Variable Step.Chinese Journal of Electronics,26(3).
MLA Tao, M.,et al."Electrical Derivative Measurement of High-Power InGaAs LDs Under Scanning Current with Variable Step".Chinese Journal of Electronics 26.3(2017).
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