Radiometric calibration of hyper-spectral imaging spectrometer based on optimizing multi-spectral band selection

	Radiometric calibration of hyper-spectral imaging spectrometer based on optimizing multi-spectral band selection
	Sun, L.-w.; X. Ye; W. Fang; Z.-l. He; X.-l. Yi and Y.-p. Wang
	2017
发表期刊	Optoelectronics Letters
卷号	13 期号:6
摘要	Hyper-spectral imaging spectrometer has high spatial and spectral resolution. Its radiometric calibration needs the knowledge of the sources used with high spectral resolution. In order to satisfy the requirement of source, an on-orbit radiometric calibration method is designed in this paper. This chain is based on the spectral inversion accuracy of the calibration light source. We compile the genetic algorithm progress which is used to optimize the channel design of the transfer radiometer and consider the degradation of the halogen lamp, thus realizing the high accuracy inversion of spectral curve in the whole working time. The experimental results show the average root mean squared error is 0.396%, the maximum root mean squared error is 0.448%, and the relative errors at all wavelengths are within 1% in the spectral range from 500 nm to 900 nm during 100 h operating time. The design lays a foundation for the high accuracy calibration of imaging spectrometer. 2017, Tianjin University of Technology and Springer-Verlag GmbH Germany, part of Springer Nature.
收录类别	sci ; ei
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/59203
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Sun, L.-w.,X. Ye,W. Fang,et al. Radiometric calibration of hyper-spectral imaging spectrometer based on optimizing multi-spectral band selection[J]. Optoelectronics Letters,2017,13(6).
APA	Sun, L.-w.,X. Ye,W. Fang,Z.-l. He,&X.-l. Yi and Y.-p. Wang.(2017).Radiometric calibration of hyper-spectral imaging spectrometer based on optimizing multi-spectral band selection.Optoelectronics Letters,13(6).
MLA	Sun, L.-w.,et al."Radiometric calibration of hyper-spectral imaging spectrometer based on optimizing multi-spectral band selection".Optoelectronics Letters 13.6(2017).

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