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Analysis of correlation characteristics of 1/f noise generated by intermittency
Guan, J.; F.-L. Gao; C. Zhang; J.-S. Cao; Z.-G. Zhang and S.-X. Guo
2016
发表期刊Tien Tzu Hsueh Pao/Acta Electronica Sinica
卷号44期号:6
摘要Based on the measured optical constants of titanium alloy TC4 in temperature range 298 similar to 773K, the bidirectional reflectance distribution function (BRDF) of rough titanium alloy TC4 surface was studied by numerical simulation with the Monte Carlo raytracing approach. The effect of different polarized light incidence, different surface roughness and different temperature on BRDF distribution of rough titanium alloy surface was' analyzed. The results show that, the change of BRDF distribution with the incident angle and the roughness of titanium alloy under polarized light is the same as that for unpolarized light. The BRDF of rough titanium alloy surface in incident plane changes with light polarization has the same trend with that of smooth plate. The BRDF peak under TE light incidence is greater than that of TM light. The BRDF peak in specular reflective direction of rough titanium alloy surface decreases with temperature increasing. In the temperature range studied in this paper (298 similar to 773 K), the peak changes within 10. 2%. The effect of temperature on the BRDF distribution of titanium alloy under TM polarized light is greater than that of TE light, which increases with the increase of incident angle.
文章类型期刊
收录类别EI
语种中文
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/56935
专题中科院长春光机所知识产出
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Guan, J.,F.-L. Gao,C. Zhang,et al. Analysis of correlation characteristics of 1/f noise generated by intermittency[J]. Tien Tzu Hsueh Pao/Acta Electronica Sinica,2016,44(6).
APA Guan, J.,F.-L. Gao,C. Zhang,J.-S. Cao,&Z.-G. Zhang and S.-X. Guo.(2016).Analysis of correlation characteristics of 1/f noise generated by intermittency.Tien Tzu Hsueh Pao/Acta Electronica Sinica,44(6).
MLA Guan, J.,et al."Analysis of correlation characteristics of 1/f noise generated by intermittency".Tien Tzu Hsueh Pao/Acta Electronica Sinica 44.6(2016).
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