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Error analysis of scanning pentaprism system in optical testing on large aperture flat mirror
Qi, E.; X. Luo; M. Li; L. Zheng and X. Zhang
2015
发表期刊Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering
卷号44期号:2页码:639-646
摘要The scanning pentaprism system has advanta ge of simple structure, quick optical testing and providing precise measurement of low order aberrations, it is an effective method for guiding optical manufacturing of large aperture flat mirror. In order to improve the scanning pentaprism technology, this letter makes detailed analysis on the error sources include pentaprism manufacturing error, thermal effect, components'position motion, mapping error, autocollimator measurement uncertainty in the scanning pentaprism system, and derives their exact influence on the system. The analysis results show that the system's measurement uncertainty on single testing point can be about 230 nrad under current laboratory environment, and the accuracy of scanning pentaprism system is mainly limited by the measurement uncertainty of the autocollimator and the thermal effect, which providing the proceedings that should be cared for improving the system performance. This study also gives an important reference for the error analysis and precision distribution in design of the scanning pentaprism system. , 2015, Chinese Society of Astronautics. All right reserved.
文章类型期刊论文
收录类别EI
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/56289
专题中科院长春光机所知识产出
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Qi, E.,X. Luo,M. Li,et al. Error analysis of scanning pentaprism system in optical testing on large aperture flat mirror[J]. Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering,2015,44(2):639-646.
APA Qi, E.,X. Luo,M. Li,&L. Zheng and X. Zhang.(2015).Error analysis of scanning pentaprism system in optical testing on large aperture flat mirror.Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering,44(2),639-646.
MLA Qi, E.,et al."Error analysis of scanning pentaprism system in optical testing on large aperture flat mirror".Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering 44.2(2015):639-646.
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