Electron cloud diffusion property of photon counting detector based on induction readout

	Electron cloud diffusion property of photon counting detector based on induction readout
	Han S.-L.; Chen B.; Ni Q.-L.; Zhang H.-J.
	2014
发表期刊	Guangxue Jingmi Gongcheng/Optics and Precision Engineering
ISSN	ISBN/1004924X
卷号	22 期号:7 页码:1732-1736
摘要	In consideration of the great influence of the sheet resistance of Ge thin film in a single-photon counting imaging detector on its imaging characteristics, this paper explores the selection of the resistance range. As the resistance values are relative to charge cloud diffusion on the Ge thin film, it will effect the counting rate and resolution ratio of the single-photon counting imaging detector. Therefore, the charge cloud diffusion characteristics on the Ge thin film under condition of absorbing boundary were analyzed based on FICK diffusion law and the relationship of the time of charge cloud diffusion on the thin film and the sheet resistance was calculated by the finite diffusion equation. The analysis results show that the photon counting detector has well spatial resolution and counting rate when the sheet resistance of Ge thin film is between 30 M/ and 2700 M/. The imaging experiments on Ge film anode with different resistance values were performed, and obtained data demonstrate that the resolution of the photo counting detector can reach 0.5 mm at counting rate of 53 kc/s when sheet resistance of Ge thin film is in the theoretical range, which proves the validity of resistance value selection range by the proposed method.
收录类别	EI
语种	中文
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/43954
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Han S.-L.,Chen B.,Ni Q.-L.,et al. Electron cloud diffusion property of photon counting detector based on induction readout[J]. Guangxue Jingmi Gongcheng/Optics and Precision Engineering,2014,22(7):1732-1736.
APA	Han S.-L.,Chen B.,Ni Q.-L.,&Zhang H.-J..(2014).Electron cloud diffusion property of photon counting detector based on induction readout.Guangxue Jingmi Gongcheng/Optics and Precision Engineering,22(7),1732-1736.
MLA	Han S.-L.,et al."Electron cloud diffusion property of photon counting detector based on induction readout".Guangxue Jingmi Gongcheng/Optics and Precision Engineering 22.7(2014):1732-1736.

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