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Damage effect of charged coupled device with multiple-pulse picosecond laser
Shao J.-F.; Liu Y.; Wang T.-F.; Guo J.
2014
发表期刊Binggong Xuebao/Acta Armamentarii
ISSNISBN/10001093
卷号35期号:9页码:1408-1413
摘要The action mechanism of high repetitive ultra-short laser interaction on electro-optic system has been drawn great attention recently. The experimental damage effect and mechanism of single and multiple-pulse picosecond lasers on Wat-902B interline charged coupled device (CCD) are reserched. The experimental setup mainly includes lasers, test subject, and camera. It maintains that the picosecond laser points at the optical entrance puil of camera all the time. The camera is installed on an electric revolving stage to control the time of intersection between a laser and the test subject. The second moment method is employed to obtain the laser diameters on CCD surface and its accuracy is better than 20.3%. The experimental results show that the functional damage threshold of multiple-pulse laser is about 13.6~121.0 mJ/cm2, which is severely lower than that of 1.5 ns and 400 ps kilohertz-repetition-rate single-pulse lasers, approximating 263~1146 mJ/cm2. The damage mechanism of single-pulse laser is to lead to short circuit between CCD vertical transfer electrode lines, but the damage mechanism of multiple-pulse laser is obviously different from that of single pulse laser, which is to cause an accumulated damage effect.
收录类别EI
语种中文
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/43823
专题中科院长春光机所知识产出
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GB/T 7714
Shao J.-F.,Liu Y.,Wang T.-F.,et al. Damage effect of charged coupled device with multiple-pulse picosecond laser[J]. Binggong Xuebao/Acta Armamentarii,2014,35(9):1408-1413.
APA Shao J.-F.,Liu Y.,Wang T.-F.,&Guo J..(2014).Damage effect of charged coupled device with multiple-pulse picosecond laser.Binggong Xuebao/Acta Armamentarii,35(9),1408-1413.
MLA Shao J.-F.,et al."Damage effect of charged coupled device with multiple-pulse picosecond laser".Binggong Xuebao/Acta Armamentarii 35.9(2014):1408-1413.
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