Changchun Institute of Optics,Fine Mechanics and Physics,CAS
| Noise as reliability screening for semiconductor lasers | |
| 其他题名 | 论文其他题名 |
| Guijun H.; Jiawei S.; Xiaosong Y.; Jing L. | |
| 2003 | |
| 发表期刊 | Applied Physics B-Lasers and Optics
 |
| ISSN | 0946-2171 |
| 卷号 | 76期号:4页码:359-363 |
| 摘要 | The low-frequency electrical noise in semiconductor lasers is measured and used for device-reliability screening, which is a sensitive and non-destructive method. In the experiment, we developed some approaches to improve the validity of reliability screening by using noise criteria. A new method of determining the threshold level of noise criteria is given. The experimental results show that this method is effective. |
| 收录类别 | SCI ; EI |
| 语种 | 英语 |
| 文献类型 | 期刊论文 |
| 条目标识符 | http://ir.ciomp.ac.cn/handle/181722/26833 |
| 专题 | 中科院长春光机所知识产出 |
| 推荐引用方式 GB/T 7714 | Guijun H.,Jiawei S.,Xiaosong Y.,et al. Noise as reliability screening for semiconductor lasers[J]. Applied Physics B-Lasers and Optics,2003,76(4):359-363. |
| APA | Guijun H.,Jiawei S.,Xiaosong Y.,&Jing L..(2003).Noise as reliability screening for semiconductor lasers.Applied Physics B-Lasers and Optics,76(4),359-363. |
| MLA | Guijun H.,et al."Noise as reliability screening for semiconductor lasers".Applied Physics B-Lasers and Optics 76.4(2003):359-363. |
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