Noise as reliability screening for semiconductor lasers

	Noise as reliability screening for semiconductor lasers
其他题名	论文其他题名
	Guijun H.; Jiawei S.; Xiaosong Y.; Jing L.
	2003
发表期刊	Applied Physics B-Lasers and Optics
ISSN	0946-2171
卷号	76 期号:4 页码:359-363
摘要	The low-frequency electrical noise in semiconductor lasers is measured and used for device-reliability screening, which is a sensitive and non-destructive method. In the experiment, we developed some approaches to improve the validity of reliability screening by using noise criteria. A new method of determining the threshold level of noise criteria is given. The experimental results show that this method is effective.
收录类别	SCI ; EI
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/26833
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Guijun H.,Jiawei S.,Xiaosong Y.,et al. Noise as reliability screening for semiconductor lasers[J]. Applied Physics B-Lasers and Optics,2003,76(4):359-363.
APA	Guijun H.,Jiawei S.,Xiaosong Y.,&Jing L..(2003).Noise as reliability screening for semiconductor lasers.Applied Physics B-Lasers and Optics,76(4),359-363.
MLA	Guijun H.,et al."Noise as reliability screening for semiconductor lasers".Applied Physics B-Lasers and Optics 76.4(2003):359-363.