Changchun Institute of Optics,Fine Mechanics and Physics,CAS
An improved method and experimental results of noise used as reliability estimation for semiconductor lasers | |
其他题名 | 论文其他题名 |
Hu G. J.; Shi J. W.; Shi Y. X.; Yang X. S.; Li J. | |
2003 | |
发表期刊 | Optics and Laser Technology |
ISSN | 0030-3992 |
卷号 | 35期号:6页码:481-483 |
摘要 | The low-frequency noise is a sensitive non-destructive indicator of semiconductor devices reliability. In this paper, the noises in InGaAsP/InGaAs/GaAlAs double quantum well semiconductor laser diodes (LDs) are measured, and the correlation between the noise and device reliability is studied. The insults indicate that the noise level in the LDs operating in low bias current is very important for estimating device reliability. So when noise is used as reliability indicator, the noise levels in LDs operating in both low and higher bias current should be considered, which improves the validity of reliability estimation. (C) 2003 Elsevier Science Ltd. All rights reserved. |
收录类别 | SCI ; EI |
语种 | 英语 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ciomp.ac.cn/handle/181722/26832 |
专题 | 中科院长春光机所知识产出 |
推荐引用方式 GB/T 7714 | Hu G. J.,Shi J. W.,Shi Y. X.,et al. An improved method and experimental results of noise used as reliability estimation for semiconductor lasers[J]. Optics and Laser Technology,2003,35(6):481-483. |
APA | Hu G. J.,Shi J. W.,Shi Y. X.,Yang X. S.,&Li J..(2003).An improved method and experimental results of noise used as reliability estimation for semiconductor lasers.Optics and Laser Technology,35(6),481-483. |
MLA | Hu G. J.,et al."An improved method and experimental results of noise used as reliability estimation for semiconductor lasers".Optics and Laser Technology 35.6(2003):481-483. |
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