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Characterization of Cd1-xFexS diluted magnetic semiconductors grown at near phase conversion temperature
其他题名论文其他题名
Wu X. J.; Shen D. Z.; Zhang Z. Z.; Liu K. W.; Li B. H.; Zhang J. Y.; Lu Y. M.; Zhao D. X.; Yao B.; Ren X. G.; Fan X. W.
2007
发表期刊Solid State Communications
ISSN0038-1098
卷号141期号:6页码:344-347
摘要Fe-based cadmium sulfide alloy thin films have been grown on c-plane sapphire substrates by a low-pressure metalorganic chemical vapor deposition technique at different growth temperatures. From X-ray diffraction and absorption spectra of the samples, the evolutions with growth temperature show an inflexion at the growth temperature of 300 degrees C. This was attributed to the phase transformation from zinc-blende to wurtzite. With increasing growth temperature from 270 degrees C to 360 degrees C, Fe concentration in the films increases monotonously. The electronic states of Cd1-xFexS were investigated by X-ray photoelectron spectroscopy. Magnetic measurement shows Van Vleck paramagnetism of the Cd1-xFexS thin film in the temperature region below 7 K. (C) 2006 Elsevier Ltd. All rights reserved.
收录类别SCI ; EI
语种英语
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/26614
专题中科院长春光机所知识产出
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Wu X. J.,Shen D. Z.,Zhang Z. Z.,et al. Characterization of Cd1-xFexS diluted magnetic semiconductors grown at near phase conversion temperature[J]. Solid State Communications,2007,141(6):344-347.
APA Wu X. J..,Shen D. Z..,Zhang Z. Z..,Liu K. W..,Li B. H..,...&Fan X. W..(2007).Characterization of Cd1-xFexS diluted magnetic semiconductors grown at near phase conversion temperature.Solid State Communications,141(6),344-347.
MLA Wu X. J.,et al."Characterization of Cd1-xFexS diluted magnetic semiconductors grown at near phase conversion temperature".Solid State Communications 141.6(2007):344-347.
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