Changchun Institute of Optics,Fine Mechanics and Physics,CAS
Characterization of Cd1-xFexS diluted magnetic semiconductors grown at near phase conversion temperature | |
其他题名 | 论文其他题名 |
Wu X. J.; Shen D. Z.; Zhang Z. Z.; Liu K. W.; Li B. H.; Zhang J. Y.; Lu Y. M.; Zhao D. X.; Yao B.; Ren X. G.; Fan X. W. | |
2007 | |
发表期刊 | Solid State Communications
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ISSN | 0038-1098 |
卷号 | 141期号:6页码:344-347 |
摘要 | Fe-based cadmium sulfide alloy thin films have been grown on c-plane sapphire substrates by a low-pressure metalorganic chemical vapor deposition technique at different growth temperatures. From X-ray diffraction and absorption spectra of the samples, the evolutions with growth temperature show an inflexion at the growth temperature of 300 degrees C. This was attributed to the phase transformation from zinc-blende to wurtzite. With increasing growth temperature from 270 degrees C to 360 degrees C, Fe concentration in the films increases monotonously. The electronic states of Cd1-xFexS were investigated by X-ray photoelectron spectroscopy. Magnetic measurement shows Van Vleck paramagnetism of the Cd1-xFexS thin film in the temperature region below 7 K. (C) 2006 Elsevier Ltd. All rights reserved. |
收录类别 | SCI ; EI |
语种 | 英语 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ciomp.ac.cn/handle/181722/26614 |
专题 | 中科院长春光机所知识产出 |
推荐引用方式 GB/T 7714 | Wu X. J.,Shen D. Z.,Zhang Z. Z.,et al. Characterization of Cd1-xFexS diluted magnetic semiconductors grown at near phase conversion temperature[J]. Solid State Communications,2007,141(6):344-347. |
APA | Wu X. J..,Shen D. Z..,Zhang Z. Z..,Liu K. W..,Li B. H..,...&Fan X. W..(2007).Characterization of Cd1-xFexS diluted magnetic semiconductors grown at near phase conversion temperature.Solid State Communications,141(6),344-347. |
MLA | Wu X. J.,et al."Characterization of Cd1-xFexS diluted magnetic semiconductors grown at near phase conversion temperature".Solid State Communications 141.6(2007):344-347. |
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