Changchun Institute of Optics,Fine Mechanics and Physics,CAS
The reflectivity measurement of the 28.5nm multilayer mirror | |
其他题名 | 论文其他题名 |
Huang W. Z.; Li Y. J.; Gu Y. Q.; Zhang J.; You Y. L.; Cun Y. S.; He Y. L.; Lei A. L.; Chen C. L.; Ma Y. Y.; Jin C. S. | |
2003 | |
发表期刊 | Acta Physica Sinica |
ISSN | 1000-3290 |
卷号 | 52期号:4页码:809-812 |
摘要 | The reflectivity of the 28.5nm Mo/Si multilayer mirrors are measured at Xingguang-II laser facility using a flat-field grating spectrograph with the Ne-like Cr x-ray laser as a soft x-ray source. The reflectivities obtained for two samples are 0.031 and 0.096. |
收录类别 | SCI |
语种 | 中文 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ciomp.ac.cn/handle/181722/25820 |
专题 | 中科院长春光机所知识产出 |
推荐引用方式 GB/T 7714 | Huang W. Z.,Li Y. J.,Gu Y. Q.,et al. The reflectivity measurement of the 28.5nm multilayer mirror[J]. Acta Physica Sinica,2003,52(4):809-812. |
APA | Huang W. Z..,Li Y. J..,Gu Y. Q..,Zhang J..,You Y. L..,...&Jin C. S..(2003).The reflectivity measurement of the 28.5nm multilayer mirror.Acta Physica Sinica,52(4),809-812. |
MLA | Huang W. Z.,et al."The reflectivity measurement of the 28.5nm multilayer mirror".Acta Physica Sinica 52.4(2003):809-812. |
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