Method to measure spectrum intensity from laser plasma soft x-ray source

	Method to measure spectrum intensity from laser plasma soft x-ray source
其他题名	论文其他题名
	Ni Q. L.; Gong Y.; Chen B.; Cao J. L.
	2004
发表期刊	Spectroscopy and Spectral Analysis
ISSN	1000-0593
卷号	24 期号:1 页码:1-3
摘要	This paper presents a method to detect and measure spectrum intensity from a laser plasma soft X-ray source. A Channel Electron Multiplier (CEM) and a caliberated silicon photodiode were used as detectors in this method, the former is a nonstandard detector and the latter is a standard one. Charge-sensitive preamplifiers were used for measuring total charges generated by detectors, and a monochromator with high resolution was employed as the spectrometer. The formulae to calculate spectrum intensity from laser plasma soft X-ray source was given, based on the known grating efficiency of the monochromator, CEM's gain and responsivity of the silicon photodiode to photons.
收录类别	SCI
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/25805
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Ni Q. L.,Gong Y.,Chen B.,et al. Method to measure spectrum intensity from laser plasma soft x-ray source[J]. Spectroscopy and Spectral Analysis,2004,24(1):1-3.
APA	Ni Q. L.,Gong Y.,Chen B.,&Cao J. L..(2004).Method to measure spectrum intensity from laser plasma soft x-ray source.Spectroscopy and Spectral Analysis,24(1),1-3.
MLA	Ni Q. L.,et al."Method to measure spectrum intensity from laser plasma soft x-ray source".Spectroscopy and Spectral Analysis 24.1(2004):1-3.

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