Changchun Institute of Optics,Fine Mechanics and Physics,CAS
Method to measure spectrum intensity from laser plasma soft x-ray source | |
其他题名 | 论文其他题名 |
Ni Q. L.; Gong Y.; Chen B.; Cao J. L. | |
2004 | |
发表期刊 | Spectroscopy and Spectral Analysis |
ISSN | 1000-0593 |
卷号 | 24期号:1页码:1-3 |
摘要 | This paper presents a method to detect and measure spectrum intensity from a laser plasma soft X-ray source. A Channel Electron Multiplier (CEM) and a caliberated silicon photodiode were used as detectors in this method, the former is a nonstandard detector and the latter is a standard one. Charge-sensitive preamplifiers were used for measuring total charges generated by detectors, and a monochromator with high resolution was employed as the spectrometer. The formulae to calculate spectrum intensity from laser plasma soft X-ray source was given, based on the known grating efficiency of the monochromator, CEM's gain and responsivity of the silicon photodiode to photons. |
收录类别 | SCI |
语种 | 英语 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ciomp.ac.cn/handle/181722/25805 |
专题 | 中科院长春光机所知识产出 |
推荐引用方式 GB/T 7714 | Ni Q. L.,Gong Y.,Chen B.,et al. Method to measure spectrum intensity from laser plasma soft x-ray source[J]. Spectroscopy and Spectral Analysis,2004,24(1):1-3. |
APA | Ni Q. L.,Gong Y.,Chen B.,&Cao J. L..(2004).Method to measure spectrum intensity from laser plasma soft x-ray source.Spectroscopy and Spectral Analysis,24(1),1-3. |
MLA | Ni Q. L.,et al."Method to measure spectrum intensity from laser plasma soft x-ray source".Spectroscopy and Spectral Analysis 24.1(2004):1-3. |
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