Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer

	Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer
其他题名	论文其他题名
	Mu Q. Q.; Liu Y. J.; Hu L. F.; Li D. Y.; Cao Z. L.; Xuan L.
	2006
发表期刊	Acta Physica Sinica
ISSN	1000-3290
卷号	55 期号:3 页码:1055-1060
摘要	Spectroscopic ellipsometry is widely used in measuring the refractive index and thickness of optical isotropic thin layers. A simple method using spectroscopic ellipsometry to measure uniaxial liquid crystal layer is introduced. A UVISEL spectroscopic phase modulated ellipsometer is used to measure the ordinary refractive index, extraordinary refractive index and thickness of the liquid crystal layer in a parallel-aligned liquid crystal cell. The phase retardation And is measured in transmission mode. The results show that the spectroscopic ellipsometry can be used to measure the anisotropic multilayer liquid crystal cell with high precision.
收录类别	SCI
语种	中文
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/25733
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Mu Q. Q.,Liu Y. J.,Hu L. F.,et al. Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer[J]. Acta Physica Sinica,2006,55(3):1055-1060.
APA	Mu Q. Q.,Liu Y. J.,Hu L. F.,Li D. Y.,Cao Z. L.,&Xuan L..(2006).Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer.Acta Physica Sinica,55(3),1055-1060.
MLA	Mu Q. Q.,et al."Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer".Acta Physica Sinica 55.3(2006):1055-1060.

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