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Optimisation of depth-graded multilayer coatings for broadband reflectivity in the soft X-ray and EUV regions
其他题名论文其他题名
Michette A. G.; Wang Z. S.
2000
发表期刊Optics Communications
ISSN0030-4018
卷号177期号:1—6页码:47-55
摘要A systematic method which allows the optimum thickness of each layer in a depth-graded multilayer coating to be determined is described. This enables specific reflectivity responses over broad wavelength bands in the soft X-ray and EUV regions to be calculated. The method is applied to the design of some depth-graded molybdenum/silicon multilayers for the wavelength range 13-19 nm, with average normal incidence reflectivities of about 13% in this range, but it is generally applicable for other material pairs and wavelength ranges. In addition, the effects of layer thickness errors on the performance of depth-graded multilayers can be simulated. The model gives better results than those based on power law variation of the layer thicknesses. (C) 2000 Elsevier Science B.V. All rights reserved.
收录类别SCI
语种英语
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/25285
专题中科院长春光机所知识产出
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Michette A. G.,Wang Z. S.. Optimisation of depth-graded multilayer coatings for broadband reflectivity in the soft X-ray and EUV regions[J]. Optics Communications,2000,177(1—6):47-55.
APA Michette A. G.,&Wang Z. S..(2000).Optimisation of depth-graded multilayer coatings for broadband reflectivity in the soft X-ray and EUV regions.Optics Communications,177(1—6),47-55.
MLA Michette A. G.,et al."Optimisation of depth-graded multilayer coatings for broadband reflectivity in the soft X-ray and EUV regions".Optics Communications 177.1—6(2000):47-55.
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