CIOMP OpenIR

浏览/检索结果: 共1条,第1-1条 帮助

已选(0)清除 条数/页:   排序方式:
The Influence of Junction Temperature Variation of LED on the Lifetime Estimation During Accelerated Aging Test 期刊论文
Ieee Access, 2019, 卷号: 7, 页码: 4773-4781
作者:  X.X.Wang;  L.Jing;  Y.Wang;  Q.Gao;  Q.Sun
浏览  |  Adobe PDF(14385Kb)  |  收藏  |  浏览/下载:249/87  |  提交时间:2020/08/24
Life testing,lifetime estimate,light emitting diodes,white leds,degradation,reliability,depreciation,Computer Science,Engineering,Telecommunications  
  • 首页
  • 上一页
  • 1
  • 下一页
  • 末页