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The Influence of Junction Temperature Variation of LED on the Lifetime Estimation During Accelerated Aging Test 期刊论文
Ieee Access, 2019, 卷号: 7, 页码: 4773-4781
作者:  X.X.Wang;  L.Jing;  Y.Wang;  Q.Gao;  Q.Sun
Adobe PDF(14385Kb)  |  收藏  |  浏览/下载：242/85  |  提交时间：2020/08/24
Life testing,lifetime estimate,light emitting diodes,white leds,degradation,reliability,depreciation,Computer Science,Engineering,Telecommunications