Analysis and Prediction of Image Quality Degradation Caused by Diffraction of Infrared Optical System Turning Marks

doi:10.3390/photonics10080937

CIOMP OpenIR

	Analysis and Prediction of Image Quality Degradation Caused by Diffraction of Infrared Optical System Turning Marks
	H. K. Ye, J. P. Zhang, S. N. Zhao, M. X. Liu and X. Zhang
	2023
发表期刊	Photonics
卷号	10 期号:8 页码:18
摘要	This paper addresses the issue of reduced image quality due to annular turning marks formed by single-point diamond turning (SPDT) during the processing of metal-based mirrors and infrared lenses. An ideal single-point diamond turning marks diffraction action model to quantitatively analyze the impact of turning marks diffraction on imaging quality degradation is proposed. Based on this model, a fast estimation algorithm for the optical modulation transfer function of the system under turning marks diffraction (TMTF) is proposed. The results show that the TMTF algorithm achieves high computational accuracy, with a relative error of only 3% in diffraction efficiency, while being hundreds of times faster than rigorous coupled wave analysis (RCWA). This method is significant for reducing manufacturing costs and improving production efficiency, as it avoids the problem of being unable to compute large-size optical systems due to computational resource and time constraints.
DOI	10.3390/photonics10080937
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收录类别	sci
语种	英语
引用统计
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/68101
专题	中国科学院长春光学精密机械与物理研究所
推荐引用方式 GB/T 7714	H. K. Ye, J. P. Zhang, S. N. Zhao, M. X. Liu and X. Zhang. Analysis and Prediction of Image Quality Degradation Caused by Diffraction of Infrared Optical System Turning Marks[J]. Photonics,2023,10(8):18.
APA	H. K. Ye, J. P. Zhang, S. N. Zhao, M. X. Liu and X. Zhang.(2023).Analysis and Prediction of Image Quality Degradation Caused by Diffraction of Infrared Optical System Turning Marks.Photonics,10(8),18.
MLA	H. K. Ye, J. P. Zhang, S. N. Zhao, M. X. Liu and X. Zhang."Analysis and Prediction of Image Quality Degradation Caused by Diffraction of Infrared Optical System Turning Marks".Photonics 10.8(2023):18.

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