CIOMP OpenIR
Theoretical Exposure Dose Modeling and Phase Modulation to Pattern a VLS Plane Grating with Variable-Period Scanning Beam Interference Lithography
Y. Song; N. Zhang; Y. J. Liu; L. Zhang and Z. W. Liu
2022
发表期刊Applied Sciences-Basel
卷号12期号:15页码:13
摘要Variable-period scanning beam interference lithography (VP-SBIL) can be used to fabricate varied-line-spacing (VLS) plane gratings. The exposure phase modulation method to pattern a VLS grating with a desired groove density must be carefully devised. In this paper, a mathematical model of the total exposure dose for VLS plane grating fabrication is established. With model-based numerical calculations, the phase modulation effects of the parameters, including the fringe locked phase, fringe density, and step size, are analyzed. The parameter combinations for the phase modulation are compared and chosen, and the optimal coordinate for phase compensation is selected. The calculation results show that the theoretical errors of the groove density coefficients can be controlled within 1e-8. The mathematical model can represent the deposited exposure dose for patterning VLS gratings during the lithography process, and the chosen parameters and proposed phase modulation method are appropriate for patterning VLS gratings with VP-SBIL.
DOI10.3390/app12157946
URL查看原文
收录类别sci
语种英语
引用统计
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/67163
专题中国科学院长春光学精密机械与物理研究所
推荐引用方式
GB/T 7714
Y. Song,N. Zhang,Y. J. Liu,et al. Theoretical Exposure Dose Modeling and Phase Modulation to Pattern a VLS Plane Grating with Variable-Period Scanning Beam Interference Lithography[J]. Applied Sciences-Basel,2022,12(15):13.
APA Y. Song,N. Zhang,Y. J. Liu,&L. Zhang and Z. W. Liu.(2022).Theoretical Exposure Dose Modeling and Phase Modulation to Pattern a VLS Plane Grating with Variable-Period Scanning Beam Interference Lithography.Applied Sciences-Basel,12(15),13.
MLA Y. Song,et al."Theoretical Exposure Dose Modeling and Phase Modulation to Pattern a VLS Plane Grating with Variable-Period Scanning Beam Interference Lithography".Applied Sciences-Basel 12.15(2022):13.
条目包含的文件 下载所有文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
Theoretical Exposure(2476KB)期刊论文出版稿开放获取CC BY-NC-SA浏览 下载
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Y. Song]的文章
[N. Zhang]的文章
[Y. J. Liu]的文章
百度学术
百度学术中相似的文章
[Y. Song]的文章
[N. Zhang]的文章
[Y. J. Liu]的文章
必应学术
必应学术中相似的文章
[Y. Song]的文章
[N. Zhang]的文章
[Y. J. Liu]的文章
相关权益政策
暂无数据
收藏/分享
文件名: Theoretical Exposure Dose Modeling and Phase M.pdf
格式: Adobe PDF
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。