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Study of the Off-Axis Fresnel Zone Plate of a Microscopic Tomographic Aberration
L. Yang; Z. Y. Ma; S. Q. Liu; Q. B. Jiao; J. H. Zhang; W. Zhang; J. Pei; H. Li; Y. H. Li; Y. B. Zou; Y. X. Xu and X. Tan
2022
发表期刊Sensors
卷号22期号:3页码:16
摘要A tomographic microscopy system can achieve instantaneous three-dimensional imaging, and this type of microscopy system has been widely used in the study of biological samples; however, existing chromatographic microscopes based on off-axis Fresnel zone plates have degraded image quality due to geometric aberrations such as spherical aberration, coma aberration, and image scattering. This issue hinders the further development of chromatographic microscopy systems. In this paper, we propose a method for the design of an off-axis Fresnel zone plate with the elimination of aberrations based on double exposure point holographic surface interference. The aberration coefficient model of the optical path function was used to solve the optimal recording parameters, and the principle of the aberration elimination tomography microscopic optical path was verified. The simulation and experimental verification were carried out utilizing a Seidel coefficient, average gradient, and signal-to-noise ratio. First, the aberration coefficient model of the optical path function was used to solve the optimal recording parameters. Then, the laminar mi-coroscopy optical system was constructed for the verification of the principle. Finally, the simulation calculation results and the experimental results were verified by comparing the Seidel coefficient, average gradient, and signal-to-noise ratio of the microscopic optical system before and after the aberration elimination. The results show that for the diffractive light at the orders 0 and +/- 1, the spherical aberration W040 decreases by 62-70%, the coma aberration W131 decreases by 96-98%, the image dispersion W222 decreases by 71-82%, and the field curvature W220 decreases by 96-96%, the average gradient increases by 2.8%, and the signal-to-noise ratio increases by 18%.
DOI10.3390/s22031113
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收录类别sci ; ei
语种英语
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文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/67119
专题中国科学院长春光学精密机械与物理研究所
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L. Yang,Z. Y. Ma,S. Q. Liu,et al. Study of the Off-Axis Fresnel Zone Plate of a Microscopic Tomographic Aberration[J]. Sensors,2022,22(3):16.
APA L. Yang.,Z. Y. Ma.,S. Q. Liu.,Q. B. Jiao.,J. H. Zhang.,...&Y. X. Xu and X. Tan.(2022).Study of the Off-Axis Fresnel Zone Plate of a Microscopic Tomographic Aberration.Sensors,22(3),16.
MLA L. Yang,et al."Study of the Off-Axis Fresnel Zone Plate of a Microscopic Tomographic Aberration".Sensors 22.3(2022):16.
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