Space-based correction method for LED array misalignment in Fourier ptychographic microscopy

doi:10.1016/j.optcom.2022.128163

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	Space-based correction method for LED array misalignment in Fourier ptychographic microscopy
	Y. Q. Zhu; M. L. Sun; P. L. Wu; Q. Q. Mu; L. Xuan; D. Y. Li and B. Wang
	2022
发表期刊	Optics Communications
ISSN	0030-4018
卷号	514 页码:7
摘要	Fourier ptychographic microscopy is a super-resolution technique, which could break through the Space-Band Product (SBP) limit of the system by employing varied-illumination and phase retrieval algorithm. A LED array is used to provide angularly varying illuminations, which is portable and cheap. However, the installation accuracy of the LED array is not sufficient, resulting in position misalignment errors. The misalignment errors not only cause the calculation error of the sub-apertures in the frequency domain, but also the artifacts in reconstruction images. Although some correction methods have been proposed, the correction ability of these methods cannot deal with the misalignment errors well. In this paper, we proposed a misalignment errors correction method. This method uses the Particle swarm optimization (PSO) algorithm to search the four misalignment parameters (delta x, delta y, theta, delta h) in space domain. It is termed as Space based correction (SBC) method. Compared with the state-of-art methods, the SBC method is more stable and accuracy.& nbsp;
DOI	10.1016/j.optcom.2022.128163
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收录类别	sci ; ei
语种	英语
引用统计
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/67098
专题	中国科学院长春光学精密机械与物理研究所
推荐引用方式 GB/T 7714	Y. Q. Zhu,M. L. Sun,P. L. Wu,et al. Space-based correction method for LED array misalignment in Fourier ptychographic microscopy[J]. Optics Communications,2022,514:7.
APA	Y. Q. Zhu,M. L. Sun,P. L. Wu,Q. Q. Mu,L. Xuan,&D. Y. Li and B. Wang.(2022).Space-based correction method for LED array misalignment in Fourier ptychographic microscopy.Optics Communications,514,7.
MLA	Y. Q. Zhu,et al."Space-based correction method for LED array misalignment in Fourier ptychographic microscopy".Optics Communications 514(2022):7.

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