The deformation behavior and bending emissions of ZnO microwire affected by deformation-induced defects and thermal tunneling effect

doi:10.3390/s21175887

CIOMP OpenIR

	The deformation behavior and bending emissions of ZnO microwire affected by deformation-induced defects and thermal tunneling effect
	L. Shi; H. Wang; X. Ma; Y. Wang; F. Wang; D. Zhao and D. Shen
	2021
发表期刊	Sensors
ISSN	14248220
卷号	21 期号:17
摘要	The realization of electrically pumped emitters at micro and nanoscale, especially with flexibility or special shapes is still a goal for prospective fundamental research and application. Herein, zinc oxide (ZnO) microwires were produced to investigate the luminescent properties affected by stress. To exploit the initial stress, room temperature in situ elastic bending stress was applied on the microwires by squeezing between the two approaching electrodes. A novel unrecoverable deformation phenomenon was observed by applying a large enough voltage, resulting in the formation of additional defects at bent regions. The electrical characteristics of the microwire changed with the applied bending deformation due to the introduction of defects by stress. When the injection current exceeded certain values, bright emission was observed at bent regions, ZnO microwires showed illumination at the bent region priority to straight region. The bent emission can be attributed to the effect of thermal tunneling electroluminescence appeared primarily at bent regions. The physical mechanism of the observed thermoluminescence phenomena was analyzed using theoretical simulations. The realization of electrically induced deformation and the related bending emissions in single microwires shows the possibility to fabricate special-shaped light sources and offer a method to develop photoelectronic devices. 2021 by the authors. Licensee MDPI, Basel, Switzerland.
DOI	10.3390/s21175887
URL	查看原文
收录类别	SCI ; EI
引用统计
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/65133
专题	中国科学院长春光学精密机械与物理研究所
推荐引用方式 GB/T 7714	L. Shi,H. Wang,X. Ma,et al. The deformation behavior and bending emissions of ZnO microwire affected by deformation-induced defects and thermal tunneling effect[J]. Sensors,2021,21(17).
APA	L. Shi,H. Wang,X. Ma,Y. Wang,F. Wang,&D. Zhao and D. Shen.(2021).The deformation behavior and bending emissions of ZnO microwire affected by deformation-induced defects and thermal tunneling effect.Sensors,21(17).
MLA	L. Shi,et al."The deformation behavior and bending emissions of ZnO microwire affected by deformation-induced defects and thermal tunneling effect".Sensors 21.17(2021).

条目包含的文件		下载所有文件
文件名称/大小	文献类型	版本类型	开放类型	使用许可
The deformation beha（3455KB）	期刊论文	出版稿	开放获取	CC BY-NC-SA	浏览下载