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Thermal design and test verification of the solar X-Ray and extreme ultraviolet imager
S. J. Li,L. H. Chen and Y. T. Yang
2020
发表期刊Optik
ISSN0030-4026
卷号203页码:10
摘要This paper describes a detailed thermal design scheme to ensure the low-temperature detection requirements of the solar X-ray and extreme ultraviolet imager (XEUVI) under complex external heat flux conditions. First, the structure, working mode and internal heat sources of the imager are introduced. Second, the thermal design scheme is proposed with a combination of active and passive thermal controls. Finally, a thermal balance test of XEUVI was performed in a vacuum environment. The test results showed that the CCD temperature ranged from -65.6 degrees C to -56.3 degrees C, the optical system temperature ranged from 12.9 degrees C to 22.0 degrees C, the frame temperature ranged from -4.6 degrees C to 20.3 degrees C, the motor temperature ranged from 1.0 degrees C to 19.8 degrees C, and the electrical box temperature ranged from -2 degrees C to 38.8 degrees C. The results of testing meet the requirements of the thermal control indices, and the thermal balance test verifies the correctness of the thermal design.
DOI10.1016/j.ijleo.2019.164017
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收录类别SCI ; EI
语种英语
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文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/64955
专题中国科学院长春光学精密机械与物理研究所
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S. J. Li,L. H. Chen and Y. T. Yang. Thermal design and test verification of the solar X-Ray and extreme ultraviolet imager[J]. Optik,2020,203:10.
APA S. J. Li,L. H. Chen and Y. T. Yang.(2020).Thermal design and test verification of the solar X-Ray and extreme ultraviolet imager.Optik,203,10.
MLA S. J. Li,L. H. Chen and Y. T. Yang."Thermal design and test verification of the solar X-Ray and extreme ultraviolet imager".Optik 203(2020):10.
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