CIOMP OpenIR
Method for Horizontal Alignment Deviation Measurement Using Binocular Camera Without Common Target
Q. W. Li,Z. Q. Wang,C. W. Shen,W. C. Yang,J. R. Li,Y. S. Liu and W. R. Wang
2020
发表期刊Ieee Access
ISSN2169-3536
卷号8页码:184540-184549
摘要In the application of using binocular camera to measure the horizontal alignment deviation, due to the limited field of view of the camera, it is difficult for each camera to obtain all the target points to determine the position of the parts. To this end, a binocular position measurement model, where each optical camera corresponds to one cooperative target point, is established to determine the horizontal alignment deviation between the upper and lower parts. To overcome the problem of insufficient information in calculating the horizontal alignment deviation, the measurement data of a biaxial inclinometer and laser rangefinder are added. The Monte Carlo method is used to determine the error level for any position and attitude in the measurement range based on past work experience. The high accuracy of the position measurement method (the overall error does not exceed 2 mm) for a binocular camera without a common target meets the actual application requirements. This conclusion is verified by the experimental results.
DOI10.1109/access.2020.3029593
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收录类别SCI
语种英语
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被引频次:2[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/64675
专题中国科学院长春光学精密机械与物理研究所
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GB/T 7714
Q. W. Li,Z. Q. Wang,C. W. Shen,W. C. Yang,J. R. Li,Y. S. Liu and W. R. Wang. Method for Horizontal Alignment Deviation Measurement Using Binocular Camera Without Common Target[J]. Ieee Access,2020,8:184540-184549.
APA Q. W. Li,Z. Q. Wang,C. W. Shen,W. C. Yang,J. R. Li,Y. S. Liu and W. R. Wang.(2020).Method for Horizontal Alignment Deviation Measurement Using Binocular Camera Without Common Target.Ieee Access,8,184540-184549.
MLA Q. W. Li,Z. Q. Wang,C. W. Shen,W. C. Yang,J. R. Li,Y. S. Liu and W. R. Wang."Method for Horizontal Alignment Deviation Measurement Using Binocular Camera Without Common Target".Ieee Access 8(2020):184540-184549.
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