A High-Precision Flat Field Method Based on Image Stitching for Short Wavelength Instruments

doi:10.1007/s11207-020-1583-7

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	A High-Precision Flat Field Method Based on Image Stitching for Short Wavelength Instruments
	X. J. Gao,B. Chen,L. P. He and X. Zheng
	2020
发表期刊	Solar Physics
ISSN	0038-0938
卷号	295 期号:2 页码:12
摘要	We present a method to obtain a large-scale flat field using only small offsets. The method is derived from the Kuhn, Lin, and Loranz (KLL) algorithm (Publ. Astron. Soc. Pacific103, 1097, 1991), but combined with the image stitching technique. Due to complementary images, which optimize and replace the bad edges, the accuracy is better than 0.1 root mean square across the full field of view, and the pixel-level relative error is also better than 0.1%. Another significant advantage is that its small sampling interval provides a rapid sampling time, while maintaining a large-scale and high-precision flat field (beyond 95% proportion). We have proved its high efficiency and robustness by simulating a cosine and a Gaussian CCD response and comparing the results with the KLL algorithm. Finally, a visible non-uniform target experiment with a uniform response was performed to prepare for the upcoming solar X-ray Extreme Ultraviolet Imager (X-EUVI) instrument on the FengYun-3 (FY-3) weather satellite series.
DOI	10.1007/s11207-020-1583-7
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收录类别	SCI
语种	英语
引用统计
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/64574
专题	中国科学院长春光学精密机械与物理研究所
推荐引用方式 GB/T 7714	X. J. Gao,B. Chen,L. P. He and X. Zheng. A High-Precision Flat Field Method Based on Image Stitching for Short Wavelength Instruments[J]. Solar Physics,2020,295(2):12.
APA	X. J. Gao,B. Chen,L. P. He and X. Zheng.(2020).A High-Precision Flat Field Method Based on Image Stitching for Short Wavelength Instruments.Solar Physics,295(2),12.
MLA	X. J. Gao,B. Chen,L. P. He and X. Zheng."A High-Precision Flat Field Method Based on Image Stitching for Short Wavelength Instruments".Solar Physics 295.2(2020):12.

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