Evaluation of Charged Defect Energy in Two-Dimensional Semiconductors for Nanoelectronics: The WLZ Extrapolation Method

doi:10.1002/andp.201900318

CIOMP OpenIR

	Evaluation of Charged Defect Energy in Two-Dimensional Semiconductors for Nanoelectronics: The WLZ Extrapolation Method
	S. Xia,D. Wang,N. K. Chen,D. Han,X. B. Li and H. B. Sun
	2020
发表期刊	Annalen Der Physik
ISSN	0003-3804
卷号	532 期号:3 页码:13
摘要	Defects play a central role in controlling the electronic properties of two-dimensional (2D) materials and realizing the industrialization of 2D electronics. However, the evaluation of charged defects in 2D materials within first-principles calculation is very challenging and has triggered a recent development of the WLZ (Wang, Li, Zhang) extrapolation method. This method lays the foundation of the theoretical evaluation of energies of charged defects in 2D materials within the first-principles framework. Herein, the vital role of defects for advancing 2D electronics is discussed, followed by an introduction of the fundamentals of the WLZ extrapolation method. The ionization energies (IEs) obtained by this method for defects in various 2D semiconductors are then reviewed and summarized. Finally, the unique defect physics in 2D dimensions including the dielectric environment effects, defect ionization process, and carrier transport mechanism captured with the WLZ extrapolation method are presented. As an efficient and reasonable evaluation of charged defects in 2D materials for nanoelectronics and other emerging applications, this work can be of benefit to the community.
DOI	10.1002/andp.201900318
URL	查看原文
收录类别	SCI ; EI
语种	英语
引用统计
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/64503
专题	中国科学院长春光学精密机械与物理研究所
推荐引用方式 GB/T 7714	S. Xia,D. Wang,N. K. Chen,D. Han,X. B. Li and H. B. Sun. Evaluation of Charged Defect Energy in Two-Dimensional Semiconductors for Nanoelectronics: The WLZ Extrapolation Method[J]. Annalen Der Physik,2020,532(3):13.
APA	S. Xia,D. Wang,N. K. Chen,D. Han,X. B. Li and H. B. Sun.(2020).Evaluation of Charged Defect Energy in Two-Dimensional Semiconductors for Nanoelectronics: The WLZ Extrapolation Method.Annalen Der Physik,532(3),13.
MLA	S. Xia,D. Wang,N. K. Chen,D. Han,X. B. Li and H. B. Sun."Evaluation of Charged Defect Energy in Two-Dimensional Semiconductors for Nanoelectronics: The WLZ Extrapolation Method".Annalen Der Physik 532.3(2020):13.

条目包含的文件
文件名称/大小	文献类型	版本类型	开放类型	使用许可
Xia-2020-Evaluation （2707KB）	期刊论文	出版稿	开放获取	CC BY-NC-SA	浏览下载