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Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips
Y.Xu; Y.H.Wu; J.F.Wu; M.B.Chi
2019
发表期刊Applied Spectroscopy
ISSN0003-7028
卷号73期号:1页码:40-46
摘要An ultraviolet visible (UV-Vis) spectrophotometric and multiwavelength linear regression (MLR) method was developed for eliminating the influence of the surface quality of centrifugal microfluidic chips on the accuracy of their absorbance detection. The regression model is based on scalar scattering theory. The method was validated with cuvettes with different surface quality and Orange G (orange gelb) dye. The coefficients of variation (CVs) of the predicted solution concentration ratios in different cuvettes were < 1%, and the relative errors were < 1.5%. The model was shown to have higher accuracy and precision than that of traditional methods.
关键词Ultraviolet-visible,UV-Vis spectrophotometry,multiwavelength linear,regression,MLR,centrifugal microfluidic chip,surface roughness,scattering,Instruments & Instrumentation,Spectroscopy
DOI10.1177/0003702818798044
收录类别SCI ; EI
语种英语
引用统计
文献类型期刊论文
条目标识符http://ir.ciomp.ac.cn/handle/181722/62908
专题中国科学院长春光学精密机械与物理研究所
推荐引用方式
GB/T 7714
Y.Xu,Y.H.Wu,J.F.Wu,et al. Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips[J]. Applied Spectroscopy,2019,73(1):40-46.
APA Y.Xu,Y.H.Wu,J.F.Wu,&M.B.Chi.(2019).Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips.Applied Spectroscopy,73(1),40-46.
MLA Y.Xu,et al."Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips".Applied Spectroscopy 73.1(2019):40-46.
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