Changchun Institute of Optics,Fine Mechanics and Physics,CAS
Improved performance of CsPbBr3 perovskite light-emitting devices by both boundary and interface defects passivation | |
Song, L.; Guo, X. Y.; Hu, Y. S.; Lv, Y.; Lin, J.; Fan, Y.; Zhang, N.; Liu, X. Y. | |
2018 | |
发表期刊 | Nanoscale |
ISSN | 2040-3364 |
卷号 | 10期号:38页码:18315-18322 |
摘要 | Significantly enhanced luminance and current efficiency for inorganic light-emitting devices have been obtained by tetrabutylammonium bromide (TBAB) additive into perovskite precursors. Reduced nonradiative defects primarily passivated by TBAB and increased exciton binding energy are responsible for improvement of PeLED performance. By employing a TBAB-treated interfacial layer, interface defects are reduced and it results in further promotion of electroluminescence performance of PeLED, including turn-on voltage of 2.6 V, brightness as high as 67300 cd m(-2), current efficiency of 22.5 cd A(-1) and external quantum efficiency of 6.28%. Our results shed light on optimization of inorganic PeLEDs by focusing on the removal of defects both at the grain boundaries and the interfaces between carrier transport layers and perovskite emitting layers. |
关键词 | hybrid perovskite inorganic perovskites quantum dots diodes efficient voltage films Chemistry Science & Technology - Other Topics Materials Science Physics |
DOI | 10.1039/c8nr06311g |
收录类别 | SCI ; EI |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ciomp.ac.cn/handle/181722/61029 |
专题 | 中国科学院长春光学精密机械与物理研究所 |
推荐引用方式 GB/T 7714 | Song, L.,Guo, X. Y.,Hu, Y. S.,et al. Improved performance of CsPbBr3 perovskite light-emitting devices by both boundary and interface defects passivation[J]. Nanoscale,2018,10(38):18315-18322. |
APA | Song, L..,Guo, X. Y..,Hu, Y. S..,Lv, Y..,Lin, J..,...&Liu, X. Y..(2018).Improved performance of CsPbBr3 perovskite light-emitting devices by both boundary and interface defects passivation.Nanoscale,10(38),18315-18322. |
MLA | Song, L.,et al."Improved performance of CsPbBr3 perovskite light-emitting devices by both boundary and interface defects passivation".Nanoscale 10.38(2018):18315-18322. |
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