CIOMP OpenIR
Opposite target measurement based on infrared radiation characteristic system
Qiao, Tie-Ying; Cai, Li-Hua; Li, Ning; Li, Zhou; Li, Cheng-Hao
2018
Source PublicationChinese Optics
ISSN20951531
Volume11Issue:5Pages:804-811
AbstractThe ground-based infrared theodolite is one of the most important means of measuring infrared data of military and scientific targets in space. With the rapid development of modern weapons technology in stealth, the measurement of surface target is becoming more and more important and the radiation brightness is a key indicator of surface type infrared combat. Therefore, it is of great significance to study area analysis method and radiance calculation method to test the stealth performance of the aviation target and to develop surface type infrared false target. In this paper, a simple and reliable method for extracting surface targets is proposed. By this method, radiation measurement is performed on a 600 mm aperture infrared theodolite. The measured data is compared with the standard brightness value after atmospheric correction. The experimental results show that the maximum error of the radiance inversion is 11.38% and the root mean square error is 7.36%. The experimental results show the effectiveness and reliability of the measurement method. 2018, China Science Publishing & Media LTD. All right reserved.
KeywordInfrared radiation Luminance Mean square error Stealth technology
DOI10.3788/CO.20181105.0804
Indexed ByEI
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Document Type期刊论文
Identifierhttp://ir.ciomp.ac.cn/handle/181722/60745
Collection中国科学院长春光学精密机械与物理研究所
Recommended Citation
GB/T 7714
Qiao, Tie-Ying,Cai, Li-Hua,Li, Ning,et al. Opposite target measurement based on infrared radiation characteristic system[J]. Chinese Optics,2018,11(5):804-811.
APA Qiao, Tie-Ying,Cai, Li-Hua,Li, Ning,Li, Zhou,&Li, Cheng-Hao.(2018).Opposite target measurement based on infrared radiation characteristic system.Chinese Optics,11(5),804-811.
MLA Qiao, Tie-Ying,et al."Opposite target measurement based on infrared radiation characteristic system".Chinese Optics 11.5(2018):804-811.
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