Speckle pattern sequential extraction metric for estimating the focus spot size on a remote diffuse target

	Speckle pattern sequential extraction metric for estimating the focus spot size on a remote diffuse target
	Yu, Z.; Y. Y. Li; L. S. Liu; J. Guo; T. F. Wang and G. Q. Yang
	2017
发表期刊	Applied Optics
卷号	56 期号:32
摘要	The speckle pattern (line by line) sequential extraction (SPSE) metric is proposed by the one-dimensional speckle intensity level crossing theory. Through the sequential extraction of received speckle information, the speckle metrics for estimating the variation of focusing spot size on a remote diffuse target are obtained. Based on the simulation, we will give some discussions about the SPSE metric range of application under the theoretical conditions, and the aperture size will affect the metric performance of the observation system. The results of the analyses are verified by the experiment. This method is applied to the detection of relative static target (speckled jitter frequency is less than the CCD sampling frequency). The SPSE metric can determine the variation of the focusing spot size over a long distance, moreover, the metric will estimate the spot size under some conditions. Therefore, the monitoring and the feedback of far-field spot will be implemented laser focusing system applications and help the system to optimize the focusing performance. (C) 2017 Optical Society of America
收录类别	sci ; ei
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/59404
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Yu, Z.,Y. Y. Li,L. S. Liu,et al. Speckle pattern sequential extraction metric for estimating the focus spot size on a remote diffuse target[J]. Applied Optics,2017,56(32).
APA	Yu, Z.,Y. Y. Li,L. S. Liu,J. Guo,&T. F. Wang and G. Q. Yang.(2017).Speckle pattern sequential extraction metric for estimating the focus spot size on a remote diffuse target.Applied Optics,56(32).
MLA	Yu, Z.,et al."Speckle pattern sequential extraction metric for estimating the focus spot size on a remote diffuse target".Applied Optics 56.32(2017).

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