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Calibration devices for band range of echelle spectrometer
Yao, X.-F.; J.-C. Cui; L. Yin; N. Song and C. Sun
2017
Source PublicationGuangxue Jingmi Gongcheng/Optics and Precision Engineering
Volume25Issue:2
AbstractIn order to ensure full waveband range of echelle spectrometers, a set of calibration devices was designed. The principle, range and resolution of the calibration were discussed and studied. First, tolerance analysis of optical elements in the echelle spectrometer was performed, and the principle and process of auto spectrum calibration were introduced. Taking the focusing mirror as the adjusting object, the requirement of adjusting resolution was given according to the usage of the CCD image. Furthermore, a set of calibration device was designed, and the calibration resolution of the devices was calculated and experimentally verified. The results show that the azimuth calibration resolution is up to 0.006 25, the resolution of the pitching direction is up to 0.006 25 and the resolution of the front and rear direction is up to 0.005 mm. The calibration devices can adjust the 10 pixels band offset to the normal reception range of the CCD, thus ensuring the full spectral band range of the spectrometer. 2017, Science Press. All right reserved.
Indexed Byei
Language中文
Document Type期刊论文
Identifierhttp://ir.ciomp.ac.cn/handle/181722/59393
Collection中科院长春光机所知识产出
Recommended Citation
GB/T 7714
Yao, X.-F.,J.-C. Cui,L. Yin,et al. Calibration devices for band range of echelle spectrometer[J]. Guangxue Jingmi Gongcheng/Optics and Precision Engineering,2017,25(2).
APA Yao, X.-F.,J.-C. Cui,L. Yin,&N. Song and C. Sun.(2017).Calibration devices for band range of echelle spectrometer.Guangxue Jingmi Gongcheng/Optics and Precision Engineering,25(2).
MLA Yao, X.-F.,et al."Calibration devices for band range of echelle spectrometer".Guangxue Jingmi Gongcheng/Optics and Precision Engineering 25.2(2017).
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