Decision-Level Defect Prediction Based on Double Focuses

	Decision-Level Defect Prediction Based on Double Focuses
	Hu, C. H.; X. C. Xue; L. Huang; H. Y. Lyu; H. Q. Wang; X. Z. Li; H. L. Liu; M. Sun and W. Sun
	2017
发表期刊	Chinese Journal of Electronics
卷号	26 期号:2
摘要	This research mainly expounds upon the decision-level software defect prediction theory. The defect characteristics is the first research focus. For the first research focus, a characteristic comparison set is built out of the existing defect characteristics according to the dissimilarity of defect characteristics and the defect characteristics are organized outside the characteristic comparison set into some defect characteristic clusters to reduce the scale of the characteristic data. The defects is the second research focus. For the second research focus, the vector weights are assigned to the defect characteristics contained in the defects according to the minimum critical characteristic set. Moreover, the multi-agent algorithm integration technology is used to predict defects according to the repulsive relationship between similar defect clusters.
收录类别	sci ; ei
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/58943
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Hu, C. H.,X. C. Xue,L. Huang,et al. Decision-Level Defect Prediction Based on Double Focuses[J]. Chinese Journal of Electronics,2017,26(2).
APA	Hu, C. H..,X. C. Xue.,L. Huang.,H. Y. Lyu.,H. Q. Wang.,...&M. Sun and W. Sun.(2017).Decision-Level Defect Prediction Based on Double Focuses.Chinese Journal of Electronics,26(2).
MLA	Hu, C. H.,et al."Decision-Level Defect Prediction Based on Double Focuses".Chinese Journal of Electronics 26.2(2017).

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