Spectral calibration of medical microscopic imaging spectrometer

	Spectral calibration of medical microscopic imaging spectrometer
	Wei, W.; J.-C. Cui; Y.-G. Tang; C. Sun and M.-Z. Pan
	2016
发表期刊	Guangxue Jingmi Gongcheng/Optics and Precision Engineering
卷号	24 期号:5
摘要	Microstructure and misfit dislocation behavior in InxGa1-xAs/InP heteroepitaxial materials grown by low pressure metal organic chemical vapor deposition (LP-MOCVD) were analyzed by high resolution transmission electron microscopy (HRTEM), scanning electron microscopy (SEM), atomic force microscopy (AFM), Raman spectroscopy and Hall effect measurements. To optimize the structure of In0.82Ga0.18As/InP heterostructure, the InxGa1-xAs buffer layer was grown. The residual strain of the In0.82Ga0.18As epitaxial layer was calculated. Further, the periodic growth pattern of the misfit dislocation at the interface was discovered and verified. Then the effects of misfit dislocation on the surface morphology and microstructure of the material were studied. It is found that the misfit dislocation of high indium (In) content In0.82Ga0.82As epitaxial layer has significant influence on the carrier concentration. 2016, Tianjin University of Technology and Springer-Verlag Berlin Heidelberg.
文章类型	期刊
收录类别	EI
语种	中文
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/57277
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Wei, W.,J.-C. Cui,Y.-G. Tang,et al. Spectral calibration of medical microscopic imaging spectrometer[J]. Guangxue Jingmi Gongcheng/Optics and Precision Engineering,2016,24(5).
APA	Wei, W.,J.-C. Cui,Y.-G. Tang,&C. Sun and M.-Z. Pan.(2016).Spectral calibration of medical microscopic imaging spectrometer.Guangxue Jingmi Gongcheng/Optics and Precision Engineering,24(5).
MLA	Wei, W.,et al."Spectral calibration of medical microscopic imaging spectrometer".Guangxue Jingmi Gongcheng/Optics and Precision Engineering 24.5(2016).

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