Freeform lens collimating spectrum-folded Hadamard transform near-infrared spectrometer

	Freeform lens collimating spectrum-folded Hadamard transform near-infrared spectrometer
	Wang, X. D.; H. Liu; L. Juschkin; Y. P. Li; J. L. Xu; X. Q. Quan and Z. W. Lu
	2016
发表期刊	Optics Communications
卷号	380
摘要	Amorphous silicon (a-Si) films were prepared by radio frequency magnetron sputtering. Spectroscopic ellipsometry (SE) was utilized to detect an ordered-structure fraction in a-Si. The SE analysis of a-Si films with different thicknesses (7.0-140.0 nm) demonstrates that no more than 2.81% of medium-range order exists in the samples, and interestingly, there is a thickness dependence of optical constants for a-Si in the range of 1.5-5.0 eV.
文章类型	期刊
收录类别	SCI ; EI
语种	英语
文献类型	期刊论文
条目标识符	http://ir.ciomp.ac.cn/handle/181722/57252
专题	中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Wang, X. D.,H. Liu,L. Juschkin,et al. Freeform lens collimating spectrum-folded Hadamard transform near-infrared spectrometer[J]. Optics Communications,2016,380.
APA	Wang, X. D.,H. Liu,L. Juschkin,Y. P. Li,J. L. Xu,&X. Q. Quan and Z. W. Lu.(2016).Freeform lens collimating spectrum-folded Hadamard transform near-infrared spectrometer.Optics Communications,380.
MLA	Wang, X. D.,et al."Freeform lens collimating spectrum-folded Hadamard transform near-infrared spectrometer".Optics Communications 380(2016).