Changchun Institute of Optics,Fine Mechanics and Physics,CAS
Freeform lens collimating spectrum-folded Hadamard transform near-infrared spectrometer | |
Wang, X. D.; H. Liu; L. Juschkin; Y. P. Li; J. L. Xu; X. Q. Quan and Z. W. Lu | |
2016 | |
发表期刊 | Optics Communications |
卷号 | 380 |
摘要 | Amorphous silicon (a-Si) films were prepared by radio frequency magnetron sputtering. Spectroscopic ellipsometry (SE) was utilized to detect an ordered-structure fraction in a-Si. The SE analysis of a-Si films with different thicknesses (7.0-140.0 nm) demonstrates that no more than 2.81% of medium-range order exists in the samples, and interestingly, there is a thickness dependence of optical constants for a-Si in the range of 1.5-5.0 eV. |
文章类型 | 期刊 |
收录类别 | SCI ; EI |
语种 | 英语 |
文献类型 | 期刊论文 |
条目标识符 | http://ir.ciomp.ac.cn/handle/181722/57252 |
专题 | 中科院长春光机所知识产出 |
推荐引用方式 GB/T 7714 | Wang, X. D.,H. Liu,L. Juschkin,et al. Freeform lens collimating spectrum-folded Hadamard transform near-infrared spectrometer[J]. Optics Communications,2016,380. |
APA | Wang, X. D.,H. Liu,L. Juschkin,Y. P. Li,J. L. Xu,&X. Q. Quan and Z. W. Lu.(2016).Freeform lens collimating spectrum-folded Hadamard transform near-infrared spectrometer.Optics Communications,380. |
MLA | Wang, X. D.,et al."Freeform lens collimating spectrum-folded Hadamard transform near-infrared spectrometer".Optics Communications 380(2016). |
条目包含的文件 | 下载所有文件 | |||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
Freeform lens collim(1236KB) | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | 浏览 下载 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论